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A large-depth-of-field projected fringe profilometry using supercontinuum light illumination
Su, Wei-Hung, Shi, Kebin, Liu, Zhiwen, Wang, Bo, Reichard, Karl, Yin, ShizhuoVolume:
13
Year:
2005
Language:
english
Journal:
oe/13/3/oe-13-3-1025.pdf
DOI:
10.1364/OPEX.13.001025
File:
PDF, 1015 KB
english, 2005