Comprehensive modeling of near-field nano-patterning

Comprehensive modeling of near-field nano-patterning

Rumpf, Raymond C., Johnson, Eric G
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Volume:
13
Year:
2005
Language:
english
Journal:
oe/13/18/oe-13-18-7198.pdf
DOI:
10.1364/OPEX.13.007198
File:
PDF, 326 KB
english, 2005
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