Reliability in the oxide vertical-cavity surface-emitting...

Reliability in the oxide vertical-cavity surface-emitting lasers exposed to electrostatic discharge

Kim, Hee-Dae, Jeong, Weon-Guk, Shin, Hyun-Ee, Ser, Jung-Hoon, Shin, Hyun-Kuk, Ju, Young-Gu
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Volume:
14
Year:
2006
Language:
english
Journal:
oe/14/25/oe-14-25-12432.pdf
DOI:
10.1364/OE.14.012432
File:
PDF, 208 KB
english, 2006
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