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Refractive index and extinction coefficient dependence of thin Al and Ir films on deposition technique and thickness
Lehmuskero, Anni, Kuittinen, Markku, Vahimaa, PasiVolume:
15
Year:
2007
Language:
english
Journal:
oe/15/17/oe-15-17-10744.pdf
DOI:
10.1364/OE.15.010744
File:
PDF, 7.06 MB
english, 2007