Terahertz profilometry at 600 GHz with 0.5 μm depth...

Optics Express 2008 Vol. 16; Iss. 15

Terahertz profilometry at 600 GHz with 0.5 μm depth resolution

Hils, Bernhard, Thomson, Mark D., Löffler, Torsten, von Spiegel, Wolff, am Weg, Christian, Roskos, Hartmut G., de Maagt, Peter, Doyle, Dominic, Geckeler, Ralf D.
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Volume:
16
Year:
2008
Language:
english
Journal:
oe/16/15/oe-16-15-11289.pdf
DOI:
10.1364/OE.16.011289
File:
PDF, 486 KB
english, 2008
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