Scanning thermal microscopy and Raman analysis of bulk...

Scanning thermal microscopy and Raman analysis of bulk fused silica exposed to lowenergy femtosecond laser pulses

Bellouard, Y., Barthel, E., Said, A. A., Dugan, M., Bado, P.
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Volume:
16
Year:
2008
Language:
english
Journal:
oe/16/24/oe-16-24-19520.pdf
DOI:
10.1364/OE.16.019520
File:
PDF, 7.52 MB
english, 2008
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