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Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing
Yaqoob, Zahid, Choi, Wonshik, Oh, Seungeun, Lue, Niyom, Park, Yongkeun, Fang-Yen, Christopher, Dasari, Ramachandra R., Badizadegan, Kamran, Feld, Michael S.Volume:
17
Year:
2009
Language:
english
Journal:
oe/17/13/oe-17-13-10681.pdf
DOI:
10.1364/OE.17.010681
File:
PDF, 274 KB
english, 2009