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High accuracy polarization measurements using binary polarization rotators
Yao, X. Steve, Chen, Xiaojun, Liu, TiegenVolume:
18
Year:
2010
Language:
english
Journal:
oe/18/7/oe-18-7-6667.pdf
DOI:
10.1364/OE.18.006667
File:
PDF, 397 KB
english, 2010