Determining mean thickness of the oxide layer by mapping...

Determining mean thickness of the oxide layer by mapping the surface of a silicon sphere

Zhang, Jitao, Li, Yan, Wu, Xuejian, Luo, Zhiyong, Wei, Haoyun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
18
Year:
2010
Language:
english
Journal:
oe/18/7/oe-18-7-7331.pdf
DOI:
10.1364/OE.18.007331
File:
PDF, 1.05 MB
english, 2010
Conversion to is in progress
Conversion to is failed