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A Novel Method for Time-resolved Characterization of Micromagnetic Stray Fields with Scanning Probe Microscopy
Bangert, J., Kasim, S., Mertin, W., Kubalek, E.Volume:
25
Language:
english
Pages:
4
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(199706)25:7/83.0.co;2-5
Date:
June, 1997
File:
PDF, 420 KB
english, 1997