X-ray phase contrast microscopy at 300 nm resolution with...

Optics Express 2010 Vol. 18; Iss. 15

X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

Pelliccia, Daniele, Sorrentino, Andrea, Bukreeva, Inna, Cedola, Alessia, Scarinci, Fernando, Ilie, Mihaela, Gerardino, Anna Maria, Fratini, Michela, Lagomarsino, Stefano
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Volume:
18
Year:
2010
Language:
english
Journal:
oe/18/15/oe-18-15-15998.pdf
DOI:
10.1364/OE.18.015998
File:
PDF, 1.75 MB
english, 2010
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