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Laser-gain scanning microscopy: a new characterization technique for dopant engineered gain media
Wisdom, Jeff A., Gaume, Romain M., Byer, Robert L.Volume:
18
Year:
2010
Language:
english
Journal:
oe/18/18/oe-18-18-18912.pdf
DOI:
10.1364/OE.18.018912
File:
PDF, 1010 KB
english, 2010