Quantitative evaluation of boron-induced disorder in...

Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications

Zatryb, G., Podhorodecki, A., Hao, X. J., Misiewicz, J., Shen, Y. S., Green, M. A.
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Volume:
18
Year:
2010
Language:
english
Journal:
oe/18/21/oe-18-21-22004.pdf
DOI:
10.1364/OE.18.022004
File:
PDF, 846 KB
english, 2010
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