Determination of the evolution of layer thickness errors...

Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy

Jiang, Hui, Michette, Alan, Pfauntsch, Slawka, Wang, Zhanshan, Zhu, Jingtao, Li, Dehui
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Volume:
19
Year:
2011
Language:
english
Journal:
oe/19/12/oe-19-12-11815.pdf
DOI:
10.1364/OE.19.011815
File:
PDF, 1.19 MB
english, 2011
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