Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy
Hell, Stefan W., Wichmann, JanVolume:
19
Year:
1994
Language:
english
Journal:
ol/19/11/ol-19-11-780.pdf
DOI:
10.1364/OL.19.000780
File:
PDF, 344 KB
english, 1994