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Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser
Kyu-Haeng Lee, Wook-Rae Cho, Jung-Ho Park, Jong-Sup Kim, Seung-Han Park, Ung KimVolume:
19
Year:
1994
Language:
english
Pages:
3
Journal:
ol/19/15/ol-19-15-1116.pdf
DOI:
10.1364/OL.19.001116
File:
PDF, 303 KB
english, 1994