Profilometry based on two-photon absorption in a silicon...

Optics Letters 2003 Vol. 28; Iss. 6

Profilometry based on two-photon absorption in a silicon avalanche photodiode

Tanaka, Yosuke, Sako, Naoya, Kurokawa, Takashi, Tsuda, Hiroyuki, Takeda, Mitsuo
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Volume:
28
Year:
2003
Language:
english
Journal:
ol/28/6/ol-28-6-402.pdf
DOI:
10.1364/OL.28.000402
File:
PDF, 127 KB
english, 2003
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