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In situ technique for measuring the orthogonality of a plane wave to a substrate
Châteauneuf, Marc, Ayliffe, Michael H., Kirk, Andrew G.Volume:
28
Year:
2003
Language:
english
Journal:
ol/28/9/ol-28-9-677.pdf
DOI:
10.1364/OL.28.000677
File:
PDF, 559 KB
english, 2003