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Multiple imaging axis microscopy improves resolution for thick-sample applications
Swoger, Jim, Huisken, Jan, Stelzer, Ernst H. K.Volume:
28
Year:
2003
Language:
english
Journal:
ol/28/18/ol-28-18-1654.pdf
DOI:
10.1364/OL.28.001654
File:
PDF, 724 KB
english, 2003