Total internal reflection ellipsometry: ultrahigh...

Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces

Poksinski, Michal, Arwin, Hans
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Volume:
32
Year:
2007
Language:
english
Journal:
ol/32/10/ol-32-10-1308.pdf
DOI:
10.1364/OL.32.001308
File:
PDF, 118 KB
english, 2007
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