Topography and refractometry of nanostructures using...

Optics Letters 2010 Vol. 35; Iss. 2

Topography and refractometry of nanostructures using spatial light interference microscopy

Wang, Zhuo, Chun, Ik Su, Li, Xiuling, Ong, Zhun-Yong, Pop, Eric, Millet, Larry, Gillette, Martha, Popescu, Gabriel
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Volume:
35
Year:
2010
Language:
english
Journal:
ol/35/2/ol-35-2-208.pdf
DOI:
10.1364/OL.35.000208
File:
PDF, 404 KB
english, 2010
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