High Frequency Probing of Nanometric Resolution Using...

Optics and Photonics News 1999 Vol. 10; Iss. 12

High Frequency Probing of Nanometric Resolution Using Near-Field Optical Heterodyne Technology

Ali, Mohammed E., Fetterman, Harold R., Han, Seok K., Kang, Kwang Y.
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Volume:
10
Year:
1999
Language:
english
Journal:
opn/10/12/opn-10-12-23.pdf
DOI:
10.1364/OPN.10.12.000023
File:
PDF, 213 KB
english, 1999
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