Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods
Gorbunov, Maxim S., Vasilegin, Boris V., Antonov, Andrey A., Osipenko, Pavel N., Zebrev, Gennady I., Anashin, Vasily S., Emeliyanov, Vladimir V., Ozerov, Alexander I., Useinov, Rustem G., Chumakov, AlVolume:
59
Language:
english
Pages:
6
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2183147
Date:
August, 2012
File:
PDF, 1.15 MB
english, 2012