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Insight into distribution and switching of resistive random-access memory filaments based on analysis of variations in memory characteristics
Kinoshita, Kentaro, Tanaka, Hayato, Yoshihara, Masataka, Kishida, SatoruVolume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4745056
File:
PDF, 705 KB
english, 2012