![](/img/cover-not-exists.png)
In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes
Araujo, P. T., Barbosa Neto, N. M., Chacham, H., Carara, S. S., Soares, J. S., Souza, A. D., Cançado, L. G., de Oliveira, A. B., Batista, R. J. C., Joselevich, E., Dresselhaus, M. S., Jorio, A.Volume:
12
Language:
english
Pages:
7
Journal:
Nano Letters
DOI:
10.1021/nl3016347
Date:
August, 2012
File:
PDF, 353 KB
english, 2012