Coverage Driven High-Level Test Generation Using a...

Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits

Alizadeh, B., Mirzaei, M., Fujita, M.
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Volume:
29
Year:
2010
Language:
english
Pages:
12
DOI:
10.1109/tcad.2010.2043571
File:
PDF, 653 KB
english, 2010
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