Simultaneous scanning tunneling microscopy and stress...

Simultaneous scanning tunneling microscopy and stress measurements to elucidate the origins of surface forces

Narushima, Tetsuya, Kinahan, Niall T., Boland, John J.
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Volume:
78
Year:
2007
Language:
english
DOI:
10.1063/1.2736417
File:
PDF, 1.20 MB
english, 2007
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