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[IEEE Computer Soc 18th International Conference on VLSI Design - Kolkata, India (3-7 Jan. 2005)] 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design - A universal random test generator for functional verification of microprocessors and system-on-chip
Uday Bhaskar, K., Prasanth, M., Chandramouli, G., Kamakoti, V.Year:
2005
Language:
english
Pages:
6
DOI:
10.1109/icvd.2005.37
File:
PDF, 194 KB
english, 2005