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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - A Unified Error Control Coding Scheme to Enhance the Reliability of a Hybrid Wireless Network-on-Chip
Ganguly, Amlan, Pande, Partha, Belzer, Benjamin, Nojeh, AlirezaYear:
2011
Language:
english
Pages:
9
DOI:
10.1109/dft.2011.24
File:
PDF, 870 KB
english, 2011