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Three-axis correction of distortion due to positional drift in scanning probe microscopy
Follin, Nathan D., Taylor, Keefer D., Musalo, Christopher J., Trawick, Matthew L.Volume:
83
Year:
2012
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4738646
File:
PDF, 1.10 MB
english, 2012