Sub-pixel porosity revealed by x-ray scatter dark field...

Journal of Applied Physics 2011 Vol. 110; Iss. 4

Sub-pixel porosity revealed by x-ray scatter dark field imaging

Revol, V., Jerjen, I., Kottler, C., Schutz, P., Kaufmann, R., Luthi, T., Sennhauser, U., Straumann, U., Urban, C.
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Volume:
110
Year:
2011
Language:
english
DOI:
10.1063/1.3624592
File:
PDF, 1.98 MB
english, 2011
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