Effects of Annealing Temperature on Electrical...

Japanese Journal of Applied Physics 2012 / 5 Vol. 51

Effects of Annealing Temperature on Electrical Characteristics of Solution-Processed Zinc Tin Oxide Thin-Film Transistors

Lee, Jeong-Soo, Kim, Yong-Jin, Lee, Yong-Uk, Kim, Yong-Hoon, Kwon, Jang-Yeon, Han, Min-Koo
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Volume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.51.061101
Date:
May, 2012
File:
PDF, 1.04 MB
english, 2012
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