![](/img/cover-not-exists.png)
[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching of MOS transistors with different layout styles
Bastos, J., Steyaert, M., Graindourze, B., Sansen, W.Year:
1996
Language:
english
Pages:
2
DOI:
10.1109/icmts.1996.535615
File:
PDF, 290 KB
english, 1996