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X-ray diffraction investigation of a three-dimensional Si/SiGe quantum dot crystal
Stangl, Julian, Fromherz, Thomas, Lechner, Rainer, Wintersberger, Eugene, Bauer, Günther, Dais, Christian, Müller, Elisabeth, Grützmacher, Detlev, Holý, VaclavVolume:
79
Year:
2009
Language:
english
DOI:
10.1103/physrevb.79.035324
File:
PDF, 1.18 MB
english, 2009