[IEEE 2005 IEEE International Conference on Mechatronics - Taipei, Taiwan (10-12 July 2005)] IEEE International Conference on Mechatronics, 2005. ICM '05. - Development of a high-precision surface metrology system and its uncertainty analysis
Shih-Kang Kuo,, Wen-Ho Yang,, Chang-Ching Lin,, Koung-Ming Yeh,, Ming-June Tsai,, Chuan-Cheng Hung,Year:
2005
Language:
english
Pages:
8
DOI:
10.1109/icmech.2005.1529389
File:
PDF, 1.27 MB
english, 2005