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[IEEE Computer Soc 18th International Conference on VLSI Design - Kolkata, India (3-7 Jan. 2005)] 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design - Effects of technology and dimensional scaling on input loss prediction of RF MOSFETs
Das, T., Washburn, C., Mukund, P.R., Howard, S., Paradis, K., Jung-Geau Jang,, Kolnik, J., Burleson, J.Year:
2005
Language:
english
Pages:
6
DOI:
10.1109/icvd.2005.86
File:
PDF, 368 KB
english, 2005