[IEEE 2010 68th Annual Device Research Conference (DRC) -...

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[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Implications of record peak current density In0.53Ga0.47As Esaki tunnel diode on Tunnel FET logic applications

Mohata, D. K., Pawlik, D., Liu, L., Mookerjea, S., Saripalli, V., Rommel, S., Datta, S.
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Year:
2010
Language:
english
Pages:
2
DOI:
10.1109/drc.2010.5551856
File:
PDF, 1.06 MB
english, 2010
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