![](/img/cover-not-exists.png)
[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - On the possibility to detect and visualize electromagnetic coupling paths
Li, Hongyu, Khilkevich, Victor, Pommerenke, David, Zhang, Yaojiang, Fan, JunYear:
2011
Language:
english
Pages:
5
DOI:
10.1109/isemc.2011.6038374
File:
PDF, 464 KB
english, 2011