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[IEEE 2010 IEEE International Symposium on Industrial Electronics (ISIE 2010) - Bari, Italy (2010.07.4-2010.07.7)] 2010 IEEE International Symposium on Industrial Electronics - A new approach to establish the thermal instability condition and the failure time during the drain current focusing process in a power MOSFET working in linear zone
Consentino, GiuseppeYear:
2010
Language:
english
Pages:
6
DOI:
10.1109/isie.2010.5637435
File:
PDF, 784 KB
english, 2010