[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Reliability analysis of weak signal detection based on Duffing oscillator
Chen, Xinguo, Yang, Xiaofei, Wang, Jieyun, Han, WeiweiYear:
2011
Language:
english
Pages:
2
DOI:
10.1109/edssc.2011.6117741
File:
PDF, 91 KB
english, 2011