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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - Built-in self-test of FPGA interconnect
Stroud, C., Wijesuriya, S., Hamilton, C., Abramovici, M.Year:
1998
Language:
english
Pages:
8
DOI:
10.1109/test.1998.743180
File:
PDF, 767 KB
english, 1998