[IEEE 2012 11th IEEE International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC) - Kyoto, Japan (2012.08.22-2012.08.24)] 2012 IEEE 11th International Conference on Cognitive Informatics and Cognitive Computing - The multi-deformable assembly contact analysis of rotate test tree
Liu, Jinghua, Hu, GuichuanYear:
2012
Language:
english
Pages:
4
DOI:
10.1109/icci-cc.2012.6311185
File:
PDF, 256 KB
english, 2012