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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - Industrial environment characterization for future M2M applications
Coll, Javier Ferrer, Angskog, Per, Chilo, Jose, Stenumgaard, PeterYear:
2011
Language:
english
Pages:
4
DOI:
10.1109/isemc.2011.6038447
File:
PDF, 2.37 MB
english, 2011