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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Performance of optical speckle displacement technique near-stress concentrators
Muravsky, Leonid I., Sakharuk, Olexander M., Kostyukevych, Sergiy O., Maksymenko, Olexander P., Kostyukevych, Kateryna V., Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.Volume:
6616
Year:
2007
Language:
english
Pages:
1
DOI:
10.1117/12.726434
File:
PDF, 356 KB
english, 2007