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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Optical Security and Counterfeit Deterrence Techniques IV - Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards
Muravsky, Leonid I., Kulynych, Yaroslav P., Maksymenko, Olexander P., Voronyak, Taras I., Kostyukevych, Sergey A., van Renesse, Rudolf L.Volume:
4677
Year:
2002
Language:
english
Pages:
8
DOI:
10.1117/12.462734
File:
PDF, 185 KB
english, 2002