[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - A study on the trade-off among wirelength, number of TSV and placement with different size of TSV
Tsai, Ming-Chao, Hwang, TingTingYear:
2011
Language:
english
Pages:
4
DOI:
10.1109/vdat.2011.5783579
File:
PDF, 664 KB
english, 2011