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[IEEE 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Wiener Neustadt, Austria (May 19-20, 2005)] 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. - Error reducing techniques for the scattering parameter characterization of differential networks using a two-port network analyzer
Ken Vaz,, Ka Mun Ho,, Caggiano, M.Year:
2005
Language:
english
Pages:
6
DOI:
10.1109/isse.2005.1491052
File:
PDF, 582 KB
english, 2005