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[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - Laser scanning calibration for porous silicon substrate useful in microarray applications
Simion, Monica, Kleps, Irina, Ruta, Lavinia, Lazar, Lucia, Bragaru, Adina, Miu, Mihaela, Baciu, IonYear:
2009
Language:
english
Pages:
4
DOI:
10.1109/smicnd.2009.5336585
File:
PDF, 1.16 MB
english, 2009