[IEEE 2008 IEEE Industry Applications Society Annual Meeting (IAS) - Edmonton, Alberta, Canada (2008.10.5-2008.10.9)] 2008 IEEE Industry Applications Society Annual Meeting - A Novel Short-Circuit Detecting Scheme Using Turn-On Switching Characteristic of IGBT
Park, Byoung-Gun, Lee, Jun-Bae, Hyun, Dong-SeokYear:
2008
Language:
english
Pages:
5
DOI:
10.1109/08ias.2008.350
File:
PDF, 577 KB
english, 2008