![](/img/cover-not-exists.png)
[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - Dynamic modeling of degradation data
Mingxiao Jiang,, Yongcang Zhang,Year:
2002
Language:
english
Pages:
5
DOI:
10.1109/rams.2002.981709
File:
PDF, 361 KB
english, 2002